Analysis of a Mechanical Structure of a Microscope Sensor of Atomic Force
Andrius Dzedzickis (Vilnius Gediminas Technical University, Lithuania)
Vytautas Bučinskas (Vilnius Gediminas Technical University, Lithuania)
Vytautas Bučinskas (Vilnius Gediminas Technical University, Lithuania)
Abstract
Atomic Force Microscopy (AFM) is a method that allows obtaining an image of the surface of the sample in high resolution. This article investigates the problems associated with modeling a mechanical structure of a microscope sensor of atomic force.The paper refers to the previous scientists’ works and describes most frequently used methods of modeling, basic equations and a variety of factors that have an influence on the dynamics of the system. Also, the obtained results of earlier works are discussed.
Article in:
Lithuanian
Article published:
2015-03-05
Keyword(s): atomic force microscopy; modeling; dynamic characteristics of the system.
DOI: 10.3846/mla.2014.757
Science – Future of Lithuania / Mokslas – Lietuvos Ateitis ISSN 2029-2341, eISSN 2029-2252
This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 License.