Science – Future of Lithuania / Mokslas – Lietuvos Ateitis, Vol 6, No 6 (2014)

Analysis of a Mechanical Structure of a Microscope Sensor of Atomic Force

Andrius Dzedzickis (Vilnius Gediminas Technical University, Lithuania)
Vytautas Bučinskas (Vilnius Gediminas Technical University, Lithuania)


Atomic Force Microscopy (AFM) is a method that allows obtaining an image of the surface of the sample in high resolution. This article investigates the problems associated with modeling a mechanical structure of a microscope sensor of atomic force.The paper refers to the previous scientists’ works and describes most frequently used methods of modeling, basic equations and a variety of factors that have an influence on the dynamics of the system. Also, the obtained results of earlier works are discussed.

Article in: Lithuanian

Article published: 2015-03-05

Keyword(s): atomic force microscopy; modeling; dynamic characteristics of the system.

DOI: 10.3846/mla.2014.757

Full Text: PDF pdf

Science – Future of Lithuania / Mokslas – Lietuvos Ateitis ISSN 2029-2341, eISSN 2029-2252
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